• DocumentCode
    181453
  • Title

    A novel bi-directional high voltage PMOS with trench gate structure (Waveform Depletion MOS: WDMOS) for 65V HVICs

  • Author

    Tanaka, Kiyoshi ; Mori, Takayoshi ; Yoshida, Kenta ; Nitta, Tom ; Ipposhi, Takashi ; Maegawa, Shigeto

  • Author_Institution
    Mixed Signal Device Technol. Dept., Renesas Electron. Corp., Hitachinaka, Japan
  • fYear
    2014
  • fDate
    15-19 June 2014
  • Firstpage
    406
  • Lastpage
    409
  • Abstract
    In this paper, we propose a new bi-directional high voltage PMOSFET that improves a back-gate bias effect due to WDMOS (Waveform Depletion MOS) structure. In WDMOS structure, plural trench gates are adjacent each other. Therefore, the silicon between trench gates is easily depleted and a back-gate bias effect can be suppressed. We present excellent characteristics of the bi-directional high voltage PMOSFET with WDMOS structure.
  • Keywords
    elemental semiconductors; high-voltage engineering; power MOSFET; power integrated circuits; silicon; HVIC; WDMOS; back-gate bias effect; bidirectional high voltage PMOSFET; high-voltage integrated circuits; trench gate structure; voltage 65 V; waveform depletion MOS; Bidirectional control; Capacitors; Logic gates; MOSFET circuits; Silicon; Transistors; Wavelength division multiplexing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on
  • Conference_Location
    Waikoloa, HI
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4799-2917-7
  • Type

    conf

  • DOI
    10.1109/ISPSD.2014.6856062
  • Filename
    6856062