• DocumentCode
    181457
  • Title

    A wide bandgap silicon carbide (SiC) gate driver for high-temperature and high-voltage applications

  • Author

    Lamichhane, Ranjan R. ; Ericsson, Nance ; Frank, Shane ; Britton, Chuck ; Marlino, Laura ; Mantooth, Alan ; Francis, Matt ; Shepherd, Peter ; Glover, Michael ; Perez, Sandra ; McNutt, Ty ; Whitaker, Barbee ; Cole, Zach

  • Author_Institution
    Intel Corp. Hillsboro, Hillsboro, OR, USA
  • fYear
    2014
  • fDate
    15-19 June 2014
  • Firstpage
    414
  • Lastpage
    417
  • Abstract
    Limitations of silicon (Si) based power electronic devices can be overcome with Silicon Carbide (SiC) because of its remarkable material properties. SiC is a wide bandgap semiconductor material with larger bandgap, lower leakage currents, higher breakdown electric field, and higher thermal conductivity, which promotes higher switching frequencies for high power applications, higher temperature operation, and results in higher power density devices relative to Si [1]. The proposed work is focused on design of a SiC gate driver to drive a SiC power MOSFET, on a Cree SiC process, with rise/fall times (less than 100 ns) suitable for 500 kHz to 1 MHz switching frequency applications. A process optimized gate driver topology design which is significantly different from generic Si circuit design is proposed. The ultimate goal of the project is to integrate this gate driver into a Toyota Prius plug-in hybrid electric vehicle (PHEV) charger module. The application of this high frequency charger will result in lighter, smaller, cheaper, and a more efficient power electronics system.
  • Keywords
    driver circuits; hybrid electric vehicles; leakage currents; power MOSFET; semiconductor device breakdown; silicon compounds; wide band gap semiconductors; Cree process; PHEV charger module; SiC; Toyota Prius plug-in hybrid electric vehicle; bandgap; breakdown electric field; frequency 500 kHz to 1 MHz; high frequency charger; high-temperature applications; high-voltage applications; leakage currents; power MOSFET; power density devices; power electronics system; process optimized gate driver topology design; silicon based power electronic devices; switching frequencies; thermal conductivity; wide bandgap semiconductor material; wide bandgap silicon carbide gate driver; Integrated circuit modeling; Logic gates; MOSFET; Power electronics; Silicon; Silicon carbide; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on
  • Conference_Location
    Waikoloa, HI
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4799-2917-7
  • Type

    conf

  • DOI
    10.1109/ISPSD.2014.6856064
  • Filename
    6856064