DocumentCode :
181457
Title :
A wide bandgap silicon carbide (SiC) gate driver for high-temperature and high-voltage applications
Author :
Lamichhane, Ranjan R. ; Ericsson, Nance ; Frank, Shane ; Britton, Chuck ; Marlino, Laura ; Mantooth, Alan ; Francis, Matt ; Shepherd, Peter ; Glover, Michael ; Perez, Sandra ; McNutt, Ty ; Whitaker, Barbee ; Cole, Zach
Author_Institution :
Intel Corp. Hillsboro, Hillsboro, OR, USA
fYear :
2014
fDate :
15-19 June 2014
Firstpage :
414
Lastpage :
417
Abstract :
Limitations of silicon (Si) based power electronic devices can be overcome with Silicon Carbide (SiC) because of its remarkable material properties. SiC is a wide bandgap semiconductor material with larger bandgap, lower leakage currents, higher breakdown electric field, and higher thermal conductivity, which promotes higher switching frequencies for high power applications, higher temperature operation, and results in higher power density devices relative to Si [1]. The proposed work is focused on design of a SiC gate driver to drive a SiC power MOSFET, on a Cree SiC process, with rise/fall times (less than 100 ns) suitable for 500 kHz to 1 MHz switching frequency applications. A process optimized gate driver topology design which is significantly different from generic Si circuit design is proposed. The ultimate goal of the project is to integrate this gate driver into a Toyota Prius plug-in hybrid electric vehicle (PHEV) charger module. The application of this high frequency charger will result in lighter, smaller, cheaper, and a more efficient power electronics system.
Keywords :
driver circuits; hybrid electric vehicles; leakage currents; power MOSFET; semiconductor device breakdown; silicon compounds; wide band gap semiconductors; Cree process; PHEV charger module; SiC; Toyota Prius plug-in hybrid electric vehicle; bandgap; breakdown electric field; frequency 500 kHz to 1 MHz; high frequency charger; high-temperature applications; high-voltage applications; leakage currents; power MOSFET; power density devices; power electronics system; process optimized gate driver topology design; silicon based power electronic devices; switching frequencies; thermal conductivity; wide bandgap semiconductor material; wide bandgap silicon carbide gate driver; Integrated circuit modeling; Logic gates; MOSFET; Power electronics; Silicon; Silicon carbide; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on
Conference_Location :
Waikoloa, HI
ISSN :
1943-653X
Print_ISBN :
978-1-4799-2917-7
Type :
conf
DOI :
10.1109/ISPSD.2014.6856064
Filename :
6856064
Link To Document :
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