Title :
600V single chip inverter IC with new SOI technology
Author :
Hara, Kentaro ; Wada, Sho ; Sakano, Junichi ; Oda, Tetsuya ; Sakurai, Kimio ; Yamashita, Hiromasa ; Utsumi, Tomoyuki
Author_Institution :
Hitachi Res. Lab., Hitachi Ltd., Hitachi, Japan
Abstract :
A 600V three-phase single chip inverter IC has been developed using a new SOI technology instead of conventional 500V Dielectric Isolation (DI) technology. In this new technology, 600V high voltage devices were materialized with a newly introduced poly-Si field plate and a multi diffusion region in order to reduce the electric field. A new IGBT accomplishes high current density with an on-resistance of 1.8Ωmm2 by using a multi emitter structure and an n-type well layer that reduces JFET resistance between emitter channels. Moreover, a thin Si layer and universal contact structure for fast extraction of excess carriers contribute to low switching losses. The turn-off energy loss of the IGBT is 54% of that of a conventional one at 135°C. The developed inverter IC has a maximum output voltage of 600V and a maximum output current 1A. Compared to the conventional 500V IC, the operational power consumption is reduced from 2.6W to 2.3W.
Keywords :
insulated gate bipolar transistors; integrated logic circuits; logic gates; silicon-on-insulator; DI technology; IGBT; JFET resistance reduction; SOI technology; current density; dielectric isolation technology; electric field; emitter channels; high voltage devices; low switching losses; multidiffusion region; multiemitter structure; n-type well layer; polysilicon field plate; power 2.6 W to 2.3 W; temperature 135 degC; three-phase single chip inverter IC; turn-off energy loss; universal contact structure; voltage 500 V; voltage 600 V; Insulated gate bipolar transistors; Integrated circuits; Inverters; Logic gates; Power demand; Semiconductor diodes; Temperature measurement;
Conference_Titel :
Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on
Conference_Location :
Waikoloa, HI
Print_ISBN :
978-1-4799-2917-7
DOI :
10.1109/ISPSD.2014.6856065