Title :
Electrothermal Effects in Bipolar Differential Pairs
Author :
La Spina, L. ; d´Alessandro, V. ; Santagata, F. ; Rinaldi, N. ; Nanver, L.K.
Author_Institution :
Delft Univ. of Technol., Delft
fDate :
Sept. 30 2007-Oct. 2 2007
Abstract :
The electrothermal behavior of bipolar differential pairs fabricated in silicon-on-glass technology is investigated. Experimental results demonstrate that a considerable distortion of the characteristics may occur when the individual transistors are sensitive to electrothermal effects, with consequent performance and reliability reduction. Simulations are employed to support the measurements and to examine methods to reduce the electrothermal feedback.
Keywords :
bipolar transistors; distortion; silicon-on-insulator; bipolar differential pairs; distortion; electrothermal feedback; individual transistors; silicon-on-glass technology; Analog circuits; Analytical models; Bipolar transistors; Circuit simulation; Conducting materials; Electrothermal effects; Performance analysis; Performance evaluation; Silicon on insulator technology; Thermal resistance; Analog circuits; Bipolar Junction Transistor (BJT); differential pair; electrothermal analysis; silicon-on-glass; thermal instability;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 2007. BCTM '07. IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-1019-4
Electronic_ISBN :
1088-9299
DOI :
10.1109/BIPOL.2007.4351853
