Investigation on backscattering from 1D Weierstrass rough surface of layered medium

Author

Ren, X.C. ; Guo, L.X.

Author_Institution

Sch. of Sci., Xidian Univ., Xi´´an

Volume

4

fYear

2008

fDate

21-24 April 2008

Firstpage

1726

Lastpage

1729

Abstract

The electromagnetic scattering from the 1D Weierstrass rough surface of three-layered medium is studied, the formulae of the scattering coefficient for different polarization is derived using the small perturbation method. The influence of the fractal dimension, the numbers of tons , the fundamental spatial frequency ,the root mean square of rough surface, the permittivity of substrate medium, the permittivity and the mean layer thickness of intermediate medium and the frequency of the incident wave on the backscattering coefficient of HH polarization are obtained and discussed with numerical implementation.

Keywords

backscatter; electromagnetic wave polarisation; electromagnetic wave scattering; fractals; inhomogeneous media; mean square error methods; permittivity; perturbation theory; rough surfaces; 1D Weierstrass rough surface; HH polarization; backscattering coefficient; electromagnetic scattering; fractal dimension; layered medium; mean layer thickness; permittivity; perturbation method; root mean square; spatial frequency; Backscatter; Electromagnetic scattering; Electromagnetic wave polarization; Fractals; Frequency; Permittivity; Perturbation methods; Root mean square; Rough surfaces; Surface roughness;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on

Conference_Location

Nanjing

Print_ISBN

978-1-4244-1879-4

Electronic_ISBN

978-1-4244-1880-0

Type

conf

DOI

10.1109/ICMMT.2008.4540806

Filename

4540806