Title :
Investigation on backscattering from 1D Weierstrass rough surface of layered medium
Author :
Ren, X.C. ; Guo, L.X.
Author_Institution :
Sch. of Sci., Xidian Univ., Xi´´an
Abstract :
The electromagnetic scattering from the 1D Weierstrass rough surface of three-layered medium is studied, the formulae of the scattering coefficient for different polarization is derived using the small perturbation method. The influence of the fractal dimension, the numbers of tons , the fundamental spatial frequency ,the root mean square of rough surface, the permittivity of substrate medium, the permittivity and the mean layer thickness of intermediate medium and the frequency of the incident wave on the backscattering coefficient of HH polarization are obtained and discussed with numerical implementation.
Keywords :
backscatter; electromagnetic wave polarisation; electromagnetic wave scattering; fractals; inhomogeneous media; mean square error methods; permittivity; perturbation theory; rough surfaces; 1D Weierstrass rough surface; HH polarization; backscattering coefficient; electromagnetic scattering; fractal dimension; layered medium; mean layer thickness; permittivity; perturbation method; root mean square; spatial frequency; Backscatter; Electromagnetic scattering; Electromagnetic wave polarization; Fractals; Frequency; Permittivity; Perturbation methods; Root mean square; Rough surfaces; Surface roughness;
Conference_Titel :
Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-1879-4
Electronic_ISBN :
978-1-4244-1880-0
DOI :
10.1109/ICMMT.2008.4540806
