DocumentCode
1814855
Title
Determination of mechanical property of nanostructure using nano-macro equivalent mechanics method
Author
Huang, Chao-Jen ; Wu, Chung-Jung ; Teng, Hung-An ; Chiang, Kuo-Ning
Author_Institution
Dept. of Power Mech. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear
2010
fDate
22-26 Feb. 2010
Firstpage
372
Lastpage
375
Abstract
The importance of research in nanoscale structure grew in the last two decades. However, the experimental method in this research field is not yet sufficiently advanced to provide people with a reliable and suitable mechanical property. The aim of this paper was to determine the utility of the equivalent method for establishing a mechanical property definition. In this method, equivalent atomistic-continuum elements replaced an originally discrete atomic structure. The method was based on the semi-empirical potential function and the finite element method. This study utilized a spring network model to describe interaction force of bi-atoms, and to investigate the Young´s modulus of silicon/germanium, carbon nanotube, and copper in a nanostructure. The Young´s moduli of these materials were confirmed by literature. Results indicated that the equivalent mechanics method may provide the basis for a useful and convenient process.
Keywords
Ge-Si alloys; Young´s modulus; atomic structure; carbon nanotubes; copper; finite element analysis; C; Cu; Si-Ge; Young´s modulus; atomistic-continuum elements; carbon nanotube; copper; discrete atomic structure; finite element method; mechanical property; nanomacro equivalent mechanics method; nanostructured materials; semi-empirical potential function; silicon-germanium; spring network model; Copper; Crystals; Finite element methods; Mechanical factors; Modal analysis; Silicon; Young´s modulus; carbon nanotube; copper; finite element method; silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoscience and Nanotechnology (ICONN), 2010 International Conference on
Conference_Location
Sydney, NSW
Print_ISBN
978-1-4244-5261-3
Electronic_ISBN
978-1-4244-5262-0
Type
conf
DOI
10.1109/ICONN.2010.6045157
Filename
6045157
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