Title :
Electrically driven quantum dot high quality factor micropillar cavities
Author :
Höfling, S. ; Reitzenstein, S. ; Böckler, C. ; Kistner, C. ; Debusmann, R. ; Löffler, A. ; Forchel, A. ; Claudon, J. ; Grenouillet, L. ; Gérard, J.M.
Author_Institution :
Tech. Phys., Univ. Wurzburg, Wurzburg
Abstract :
We report on electrically driven quantum dot micropillar cavities with quality factors (Q-factors) up to 16.000. A special lateral current injection scheme into small mode volume micropillars is employed which ensures an efficient light outcoupling. The high Q-factors allow the observation of pronounced single dot resonance effects with a Purcell enhancement. These features make the novel electrically addressable cavities promising for single semiconductor quantum dot cavity quantum electrodynamics experiments.
Keywords :
Q-factor; semiconductor quantum dots; Purcell enhancement; electrical injection; electrically addressable cavities; electrically driven quantum dot; high quality factor micropillar cavities; light outcoupling; pronounced single dot resonance effects; single semiconductor quantum dot cavity quantum electrodynamics experiments; small mode volume micropillars; special lateral current injection scheme; Contacts; Distributed Bragg reflectors; Electrodynamics; Etching; Gallium arsenide; Microcavities; Q factor; Quantum dots; Resonance; Scanning electron microscopy; electrical injection; high quality factors; microcavity; semiconductor cavity quantum electrodynamics;
Conference_Titel :
Indium Phosphide and Related Materials, 2008. IPRM 2008. 20th International Conference on
Conference_Location :
Versailles
Print_ISBN :
978-1-4244-2258-6
Electronic_ISBN :
1092-8669
DOI :
10.1109/ICIPRM.2008.4703031