Electrically driven quantum dot high quality factor micropillar cavities

Author

Höfling, S. ; Reitzenstein, S. ; Böckler, C. ; Kistner, C. ; Debusmann, R. ; Löffler, A. ; Forchel, A. ; Claudon, J. ; Grenouillet, L. ; Gérard, J.M.

Author_Institution

Tech. Phys., Univ. Wurzburg, Wurzburg

fYear

2008

fDate

25-29 May 2008

Firstpage

1

Lastpage

3

Abstract

We report on electrically driven quantum dot micropillar cavities with quality factors (Q-factors) up to 16.000. A special lateral current injection scheme into small mode volume micropillars is employed which ensures an efficient light outcoupling. The high Q-factors allow the observation of pronounced single dot resonance effects with a Purcell enhancement. These features make the novel electrically addressable cavities promising for single semiconductor quantum dot cavity quantum electrodynamics experiments.

Keywords

Q-factor; semiconductor quantum dots; Purcell enhancement; electrical injection; electrically addressable cavities; electrically driven quantum dot; high quality factor micropillar cavities; light outcoupling; pronounced single dot resonance effects; single semiconductor quantum dot cavity quantum electrodynamics experiments; small mode volume micropillars; special lateral current injection scheme; Contacts; Distributed Bragg reflectors; Electrodynamics; Etching; Gallium arsenide; Microcavities; Q factor; Quantum dots; Resonance; Scanning electron microscopy; electrical injection; high quality factors; microcavity; semiconductor cavity quantum electrodynamics;

fLanguage

English

Publisher

ieee

Conference_Titel

Indium Phosphide and Related Materials, 2008. IPRM 2008. 20th International Conference on

Conference_Location

Versailles

ISSN

1092-8669

Print_ISBN

978-1-4244-2258-6

Electronic_ISBN

1092-8669

Type

conf

DOI

10.1109/ICIPRM.2008.4703031

Filename

4703031