Title :
Characterization of LTCC substrate up to 100 GHz
Author :
Adhikari, S. ; Stelzer, A. ; Springer, A. ; Wagner, C. ; Korden, C. ; Stadler, M.
Author_Institution :
Inst. for Commun. & Inf. Eng., Johannes Kepler Univ. Linz, Linz
Abstract :
This paper deals with the characterization of LTCC substrates up to 100 GHz. Planar transmission lines and resonators are used for characterizing the substrates. Measurement results for the relative permittivity obtained from the investigated structures are presented.
Keywords :
planar waveguides; resonators; substrates; transmission lines; LTCC substrate; planar transmission lines; planar transmission resonators; relative permittivity; Conducting materials; Dielectric loss measurement; Frequency; Loss measurement; Microstrip resonators; Millimeter wave measurements; Optical ring resonators; Permittivity measurement; Planar transmission lines; Transmission line measurements;
Conference_Titel :
Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-1879-4
Electronic_ISBN :
978-1-4244-1880-0
DOI :
10.1109/ICMMT.2008.4540821
