DocumentCode :
1815821
Title :
On challenges for implementing pixelwise DA converter in 3D
Author :
Paasio, Ari ; Ansio, Henri
Author_Institution :
Bus. & Innovation Dev. Unit, Univ. of Turku, Turku, Finland
fYear :
2012
fDate :
29-31 Aug. 2012
Firstpage :
1
Lastpage :
3
Abstract :
Vision chips are natural candidates for being among the first areas that are able to utilize the emerging 3D integration possibilities. In some 2D vision chip architectures there are pixel level AD and/or DA converters that are used for various purposes. This article covers the challenges and needs when targeting a megapixel architecture within a 1cm2 chip area. The Through-Silicon-Vias (TSVs) on one hand allow the 3D integration, but on the other hand pose strict challenges for the design. The TSVs occupy certain area and in an area restricted design, the number of TSVs should be minimized. Also the associated Keep-Out-Zone (KOZ) for each TSV should be taken into account.
Keywords :
CMOS image sensors; computer vision; digital-analogue conversion; image convertors; integrated circuit design; microprocessor chips; three-dimensional integrated circuits; 2D vision chip architechtures; 3D integration; KOZ; TSV; area restricted design; keep-out-zone; megapixel architechture; pixel level AD converters; pixel level DA converters; through-silicon-vias; vision chips; Arrays; MOSFETs; Microprocessors; Silicon; Through-silicon vias; 3D integration; DA converter; vision chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Cellular Nanoscale Networks and Their Applications (CNNA), 2012 13th International Workshop on
Conference_Location :
Turin
ISSN :
2165-0160
Print_ISBN :
978-1-4673-0287-6
Type :
conf
DOI :
10.1109/CNNA.2012.6331449
Filename :
6331449
Link To Document :
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