• DocumentCode
    1815860
  • Title

    Photoelastic and numerical investigation of thermally-induced restrained shrinkage stresses in plastics

  • Author

    Sullivan, Tim ; Rosenberg, Jehuda ; Matsuoka, Shiro

  • Author_Institution
    AT&T Bell Lab., Murray Hill, NJ, USA
  • fYear
    1988
  • fDate
    11-13 May 1988
  • Firstpage
    60
  • Lastpage
    66
  • Abstract
    A photoelastic analysis is used to determine stress distributions within an epoxy encapsulation material for idealized geometries. Experimental results are compared with analytical and numerical predictions based on actual material data. It is demonstrated that to determine quantitative stress levels using photoelasticity it is necessary to separate orientation effects from an elastically active portion of stress. These `elastic´ stress levels are predicted using linear elastic finite-element models, and agreement with experimental data is obtained when appropriate input parameters are chosen
  • Keywords
    encapsulation; integrated circuit technology; numerical analysis; packaging; photoelasticity; plastics; polymers; stress analysis; thermal stresses; elastically active portion; epoxy encapsulation material; idealized geometries; linear elastic finite-element models; material data; microelectronic packaging; orientation effects; photoelastic analysis; plastics; stress distributions; Encapsulation; Finite element methods; Microelectronics; Photoelasticity; Plastic packaging; Polymers; Predictive models; Residual stresses; Stress measurement; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal Phenomena in the Fabrication and Operation of Electronic Components: I-THERM '88, InterSociety Conference on
  • Conference_Location
    Los Angeles, CA
  • Type

    conf

  • DOI
    10.1109/ITHERM.1988.28678
  • Filename
    28678