DocumentCode
1815860
Title
Photoelastic and numerical investigation of thermally-induced restrained shrinkage stresses in plastics
Author
Sullivan, Tim ; Rosenberg, Jehuda ; Matsuoka, Shiro
Author_Institution
AT&T Bell Lab., Murray Hill, NJ, USA
fYear
1988
fDate
11-13 May 1988
Firstpage
60
Lastpage
66
Abstract
A photoelastic analysis is used to determine stress distributions within an epoxy encapsulation material for idealized geometries. Experimental results are compared with analytical and numerical predictions based on actual material data. It is demonstrated that to determine quantitative stress levels using photoelasticity it is necessary to separate orientation effects from an elastically active portion of stress. These `elastic´ stress levels are predicted using linear elastic finite-element models, and agreement with experimental data is obtained when appropriate input parameters are chosen
Keywords
encapsulation; integrated circuit technology; numerical analysis; packaging; photoelasticity; plastics; polymers; stress analysis; thermal stresses; elastically active portion; epoxy encapsulation material; idealized geometries; linear elastic finite-element models; material data; microelectronic packaging; orientation effects; photoelastic analysis; plastics; stress distributions; Encapsulation; Finite element methods; Microelectronics; Photoelasticity; Plastic packaging; Polymers; Predictive models; Residual stresses; Stress measurement; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal Phenomena in the Fabrication and Operation of Electronic Components: I-THERM '88, InterSociety Conference on
Conference_Location
Los Angeles, CA
Type
conf
DOI
10.1109/ITHERM.1988.28678
Filename
28678
Link To Document