DocumentCode
1815976
Title
Memristor crossbar arrays with junction areas towards sub-10 × 10 nm2
Author
Pi, Shuang ; Lin, Peng ; Xia, Qiangfei
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Massachusetts, Amherst, MA, USA
fYear
2012
fDate
29-31 Aug. 2012
Firstpage
1
Lastpage
2
Abstract
We used diluted hydrofluoric acid to shrink the feature size of a silicon dioxide nanoimprint mold to sub-10 nm regime. Using this mold, we have fabricated memristor crossbar arrays using nanoimprint lithography. We demonstrated that memristor devices with small junction areas exhibited bipolar non-volatile switching behavior with high ON/OFF ratio and low operational current.
Keywords
memristors; nanolithography; soft lithography; diluted hydrofluoric acid; junction areas; memristor crossbar arrays; nanoimprint lithography; silicon dioxide nanoimprint mold; Electrodes; Etching; Junctions; Memristors; Nanolithography; Nonvolatile memory; Switches; crossbar arrays; memristor; nanoimprint lithography; sub-10 nm;
fLanguage
English
Publisher
ieee
Conference_Titel
Cellular Nanoscale Networks and Their Applications (CNNA), 2012 13th International Workshop on
Conference_Location
Turin
ISSN
2165-0160
Print_ISBN
978-1-4673-0287-6
Type
conf
DOI
10.1109/CNNA.2012.6331452
Filename
6331452
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