DocumentCode :
1816024
Title :
InAs quantum dot evolution observed by in-situ scanning tunneling microscopy during molecular beam epitaxy growth
Author :
Tsukamoto, Shiro
Author_Institution :
Anan National College of Technology, Tokushima 774-0017, Japan
fYear :
2008
fDate :
25-29 May 2008
Firstpage :
1
Lastpage :
4
Abstract :
We have successfully investigated the self-assembly mechanism for InAs quantum dots (QDs) formed on GaAs(001) by using a unique scanning tunnelling microscope (STM) placed within the molecular beam epitaxy (MBE) growth chamber. The images elucidate the mechanism of QD nucleation, demonstrating directly that not all deposited In is initially incorporated into the lattice, hence providing a large supply of material to rapidly form QDs via islands containing tens of atoms. kinetic Monte Carlo (kMC) simulations based on first-principles calculations show that tiny alloy fluctuations, like atomistic point defects, in the InGaAs wetting layer prior to are crucial in determining nucleation sites.
Keywords :
Atomic layer deposition; Fluctuations; Kinetic theory; Lattices; Microscopy; Molecular beam epitaxial growth; Monte Carlo methods; Quantum dots; Self-assembly; Tunneling; GaAs; InAs; Quantum Dots; in-situ; molecular beam epixtaxy; scanning tunnelling microscope;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 2008. IPRM 2008. 20th International Conference on
Conference_Location :
Versailles, France
ISSN :
1092-8669
Print_ISBN :
978-1-4244-2258-6
Electronic_ISBN :
1092-8669
Type :
conf
DOI :
10.1109/ICIPRM.2008.4703062
Filename :
4703062
Link To Document :
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