DocumentCode :
1816147
Title :
Bacterial attachment response to nanostructured titanium surfaces
Author :
Truong, Vi Khanh ; Wang, James Y. ; Shurui, Wang ; Malherbe, Francois ; Berndt, Christopher C. ; Crawford, Russell J. ; Ivanova, Elena P.
Author_Institution :
Fac. Life & Social Sci., Swinburne Univ. of Technol., Hawthorn, VIC, Australia
fYear :
2010
fDate :
22-26 Feb. 2010
Firstpage :
253
Lastpage :
256
Abstract :
The effect of sub-nanometric surface roughness of Ti thin films surfaces on the attachment of two human pathogenic bacteria, Staphylococcus aureus CIP 65.8T and Pseudomonas aeruginosa ATCC 9027, was studied. A magnetron sputtering thin film deposition system was used to control the titanium thin film thicknesses of 3 nm, 12 nm and 150 nm on silicon wafers with corresponding surface roughness parameters of Rq 0.14 nm, 0.38 nm and 5.55 nm (1 μm × 1 μm scanning area). Analysis of bacterial retention profiles showed that the bacteria responded differently changes in the Ra and Rq (Ti thin film) surface roughness parameters of a less than 1 nm, with up to 2-3 times: more cells being retained on the surface, and elevated levels of extracellular polymeric substances being secreted on the Ti thin films, in particular on the surfaces with 0.14 nm (Rq) roughness.
Keywords :
metallic thin films; microorganisms; nanofabrication; nanostructured materials; sputter deposition; surface roughness; titanium; Pseudomonas aeruginosa ATCC 9027; Si; Staphylococcus aureus CIP 65.8T; Ti; Ti thin films surfaces; bacterial attachment response; bacterial retention profiles; cells; extracellular polymeric substances; human pathogenic bacteria; magnetron sputtering thin film deposition; nanostructured titanium surfaces; silicon wafers; size 12 nm; size 150 nm; size 3 nm; subnanometric surface roughness; Microorganisms; Rough surfaces; Surface morphology; Surface roughness; Surface topography; Surface treatment; Titanium; bacterial attachment; sub-nanometric surface morphology; titanium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoscience and Nanotechnology (ICONN), 2010 International Conference on
Conference_Location :
Sydney, NSW
Print_ISBN :
978-1-4244-5261-3
Electronic_ISBN :
978-1-4244-5262-0
Type :
conf
DOI :
10.1109/ICONN.2010.6045205
Filename :
6045205
Link To Document :
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