Title :
A new efficient transient noise analysis technique for simulation of CCD image sensors or particle detectors
Author :
Bolcato, P. ; Tawfik, M.S. ; Poujois, R. ; Jarron, P.
Author_Institution :
ANACAD Computer Systems, Meylan, France
Abstract :
A novel noise simulation technique for transient analysis is presented. This approach has been implemented in the electrical circuit simulator ELDO and is particularly useful for noise simulation in analog sampling circuits such as CCD (charge coupled device) image sensors or switched-capacitor circuits. Noise sources can be introduced into macromodels, and switched-capacitor filters or even sigma-delta modulators can be simulated without consuming too much CPU (central processing unit) time. Comparison between simulations and experimental results has been made and is shown for a 1.5-μ CMOS current mode amplifier designed for high-rate particle detectors
Keywords :
CCD image sensors; 1.5 micron; CCD image sensors; CMOS current mode amplifier; ELDO; analog sampling circuits; efficient transient noise analysis; electrical circuit simulator; macromodels; noise simulation technique; particle detectors; preamplifier; sigma-delta modulators; switched-capacitor circuits; Analytical models; Central Processing Unit; Charge coupled devices; Charge-coupled image sensors; Circuit noise; Circuit simulation; Image sampling; Image sensors; Switched capacitor circuits; Transient analysis;
Conference_Titel :
Custom Integrated Circuits Conference, 1993., Proceedings of the IEEE 1993
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0826-3
DOI :
10.1109/CICC.1993.590717
