Title :
A CMOS photosensor test-chip for smoke detection applications
Author :
Stoppa, D. ; Betta, G. -F Dalla ; Gonzo, L. ; Gottardi, M. ; Simoni, A.
Author_Institution :
Centro per la Ricerca Scientifica e Tecnologica (ITC/IRST), Trento, Italy
Abstract :
We report on a CMOS integrated photosensor specially tailored for smoke detection applications. A test chip consisting of an integrated photodiode, which reveals the light scattered by smoke particles, and of the related read-out electronics, has been designed and fabricated in 0.8 μm CMOS technology. The circuit design is based on the Switched Capacitor (SC) technique, and accomplishes low noise specifications by means of an accurate design of the first read-out stage and by employing Correlated Double Sampling (CDS) filtering blocks. Circuit simulations and preliminary results from the electrical characterization of the first chip prototype allowed the basic design methodology to be validated.
Keywords :
CMOS integrated circuits; alarm systems; integrated circuit noise; integrated optoelectronics; light scattering; mixed analogue-digital integrated circuits; photodetectors; photodiodes; readout electronics; safety systems; signal sampling; smoke; switched capacitor networks; 0.8 micron; CMOS ASIC; CMOS integrated photosensor; CMOS photosensor test-chip; SC technique; correlated double sampling filtering blocks; electrical characterization; integrated photodiode; light scattering; low noise specifications; read-out electronics; smoke detection applications; smoke particles; submicron CMOS technology; switched capacitor technique; CMOS technology; Circuit synthesis; Circuit testing; Electronic equipment testing; Integrated circuit technology; Light scattering; Particle scattering; Photodiodes; Smoke detectors; Switching circuits;
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Conference_Location :
Phoenix-Scottsdale, AZ
Print_ISBN :
0-7803-7448-7
DOI :
10.1109/ISCAS.2002.1010949