DocumentCode :
1816680
Title :
Coherent imaging of local fields in photonic crystals
Author :
Fluck, E. ; van Dijk, E. ; Korterik, J.P. ; Otter, A.M. ; Kuipers, F.S.L. ; van Hulst, N.F.
Author_Institution :
MESA Res. Inst., Twente Univ., Enschede, Netherlands
fYear :
2001
fDate :
11-11 May 2001
Firstpage :
51
Abstract :
Summary form only given. In the past years, much research has been focused on so called photonic crystals. Different ways of fabricating and simulating these structures have been introduced. Characterization is performed mostly with black box experiments, where reflected or transmitted light is detected. We demonstrate a different approach, which allows us to take a direct look inside such structures. With a heterodyne interferometric photon scanning tunneling microscope (PSTM), we are able to visualize not only the amplitude of the local optical field, but also the phase information of light propagating inside the crystal. Heterodyne interferometric photon scanning tunneling microscopy gives detailed insight in reflected and transmitted waves as they develop through periodic structures. Ultimately, this method will allow us to visualize the opening of a stop gap in one or two-dimensional photonic crystals.
Keywords :
heterodyne detection; light interferometry; optical microscopy; photonic band gap; scanning tunnelling microscopy; coherent imaging; direct look; heterodyne interferometric photon scanning tunneling microscope; local fields; local optical field amplitude; phase information; photonic crystals; Focusing; Optical attenuators; Optical imaging; Optical interferometry; Optical mixing; Optical refraction; Optical scattering; Optical variables control; Optical waveguides; Photonic crystals;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2001. QELS '01. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-663-X
Type :
conf
DOI :
10.1109/QELS.2001.961838
Filename :
961838
Link To Document :
بازگشت