• DocumentCode
    1816994
  • Title

    JFET transistors for low noise applications at low frequency

  • Author

    Arnaboldi, Claudio ; Boella, Giuliano ; Panzeri, Emanuele ; Pessina, Gianluigi

  • Author_Institution
    Dipt. di Fisica, Universita di Milano Bicocca, Italy
  • Volume
    2
  • fYear
    2003
  • fDate
    19-25 Oct. 2003
  • Firstpage
    1210
  • Abstract
    We describe an instrument capable to perform very accurate automatic noise measurements at low frequency. This way we have been able to study and select JFET transistors to be used for the readout of bolometric detectors. Design criteria and adequate biasing condition allowed to reach outstanding results in term of noise and power dissipation.
  • Keywords
    bolometers; junction gate field effect transistors; nuclear electronics; semiconductor device noise; JFET transistors; bolometric detectors; low frequency; low noise applications; Aluminum; Bolometers; Cryogenics; Detectors; Engine cylinders; Frequency; Low-frequency noise; Noise measurement; Steel; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2003 IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8257-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2003.1351910
  • Filename
    1351910
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1816994