DocumentCode :
1817061
Title :
Indium tin oxide surface topography on monolayer formation and stability
Author :
Chockalingam, Muthukumar ; Gooding, J. Justin
Author_Institution :
Sch. of Chem., Univ. of New South Wales, Sydney, NSW, Australia
fYear :
2010
fDate :
22-26 Feb. 2010
Firstpage :
182
Lastpage :
185
Abstract :
Here we report the effect of Indium tin oxide (ITO) surface structure on the formation of self assembled monolayers (SAM) derived from phosphonohexadecanoic acid with regard to coverage and stability by comparing 2 different ITO surfaces. To ascertain the extent of defects and stability, the electropolymerisation of diaminobenzene onto the monolayer modified ITO surfaces at defect sites and regions where phosphonohexadecanoic acid was poorly bonded. These surfaces were investigated using atomic force microscopy (AFM), electrochemistry and X-ray photoelectron spectroscopy (XPS).
Keywords :
X-ray photoelectron spectra; atomic force microscopy; electrochemistry; indium compounds; monolayers; polymerisation; self-assembly; surface topography; AFM; ITO; X-ray photoelectron spectroscopy; XPS; atomic force microscopy; defect sites; diaminobenzene; electrochemistry; electropolymerisation; indium tin oxide surface structure topography; phosphonohexadecanoic acid; self assembled monolayer formation; Indium tin oxide; Polymers; Rough surfaces; Surface morphology; Surface roughness; Surface topography; Surface treatment; Indium tin oxide; defects; diaminobenzene; monolayer;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoscience and Nanotechnology (ICONN), 2010 International Conference on
Conference_Location :
Sydney, NSW
Print_ISBN :
978-1-4244-5261-3
Electronic_ISBN :
978-1-4244-5262-0
Type :
conf
DOI :
10.1109/ICONN.2010.6045239
Filename :
6045239
Link To Document :
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