Title :
A 30-ps jitter, 3.6-μs locking, 3.3-volt digital PLL for CMOS gate arrays
Author :
Ko, Uming ; Wichman, Shannon A. ; Castrianni, Shawn
Author_Institution :
Texas Instruments, Inc., Dallas, TX, USA
Abstract :
A 3.3-V digital phase-locked loop (DPLL) with a 30-ps jitter resolution and 3.6-μs locking time has been developed to support a 0.65-μm CMOS gate array. The innovative DPLL features dual-mode automatic control logic for coarse and fine locking, and autorecovery circuitry to compensate for locking failure due to substantial system clock drift, and a nominal 200-μW power dissipation. Multiple DPLLs can be utilized in each gate array to support system clocks of above 100 MHz. Low-power operation is accomplished with no DC-current-consuming circuitry, in order to better serve portable applications. Multiple high-resolution DPLL instances are allowed on virtually any spot of the die, and support either 3.3-V or 5-V operation. System reliability is enhanced by the implementation of the autorecovery circuitry which monitors the high-resolution DPLL for faults caused by poor system and environmental control
Keywords :
digital phase locked loops; 0.65 micron; 200 muW; 3.6 mus; 30 ps; ASIC; CMOS gate arrays; autorecovery circuitry; clock drift; coarse locking; digital PLL; dual-mode automatic control logic; fault monitoring; fine locking; high-resolution PLL; jitter resolution; locking failure; locking time; low voltage; portable applications; power dissipation; reliability; Automatic control; Automatic logic units; CMOS logic circuits; Clocks; Jitter; Logic circuits; Phase locked loops; Phased arrays; Power dissipation; Reliability;
Conference_Titel :
Custom Integrated Circuits Conference, 1993., Proceedings of the IEEE 1993
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0826-3
DOI :
10.1109/CICC.1993.590756