DocumentCode :
1817141
Title :
Experimental demonstration of a broadband terahertz absorber using SiO2 based metamaterial structures
Author :
Man-Man Mo ; Qi-Ye Wen ; Zhi Chen ; Qing-Hui Yang ; Yu-Lan Jing ; Huai-Wu Zhang
Author_Institution :
State Key Lab. of Electron. Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear :
2013
fDate :
9-11 Sept. 2013
Firstpage :
1
Lastpage :
2
Abstract :
In this presentation, we experimentally demonstrate a broadband absorber in the terahertz (THz) spectral band. A thin silicon dioxide (SiO2) film is used as dielectric spacer. The combination of different sizes of Al squares gives rise to an absorption bandwidth over 200GHz with absorption magnitude of 90%.
Keywords :
dielectric materials; metamaterials; silicon compounds; terahertz materials; SiO2; broadband terahertz absorber; dielectric spacer; metamaterial structures; terahertz spectral band; Absorption; Broadband communication; Dielectrics; Educational institutions; Films; Laboratories; Metamaterials; Absorber; Broadband; SiO2; Terahertz;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Millimeter Waves and THz Technology Workshop (UCMMT), 2013 6th UK, Europe, China
Conference_Location :
Rome, Italy
Type :
conf
DOI :
10.1109/UCMMT.2013.6641561
Filename :
6641561
Link To Document :
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