Title :
Automated MAP-MRF EM labelling for volume determination in PET
Author :
Gribben, Hugh ; Miller, Paul ; Wang, Hongbin ; Carson, Kathryn ; Hounsell, Alan ; Zatari, Ashraf
Author_Institution :
Inst. of Electron., Queen´´s Univ. Belfast, Belfast
Abstract :
An automated, unsupervised Maximum a Posterior - Markov Random Field Expectation Maximisation (MAP- MRF EM) Labelling technique, based upon a Bayesian framework, for volume of interest (VOI) determination in Positron Emission Tomography (PET) imagery is proposed. The segmentation technique incorporates MAP-MRF modelling into a mixture modelling approach using the EM algorithm, to consider both the structural and statistical nature of the data. The performance of the algorithm has been assessed on a set of PET phantom data. Investigations revealed improvements over a simple statistical approach using the EM algorithm, and improvements over a MAP- MRF approach, using the output from the EM algorithm as an initial estimate. Improvement is also shown over a standard semi-automated thresholding method, and an automated Fuzzy Hidden Markov Chain (FHMC) approach; particularly for smaller object volume determination, as the FHMC method loses some spatial correlation. A deblurring pre-processing stage was also found to provide improved results.
Keywords :
Markov processes; image segmentation; medical image processing; phantoms; positron emission tomography; statistics; Bayesian framework; EM algorithm; MAP-MRF EM labelling; Markov random field expectation maximisation; PET imagery; PET phantom; automated fuzzy hidden Markov chain; deblurring preprocessing stage; maximum a posterior; positron emission tomography; segmentation technique; statistical nature; Bayesian methods; Image segmentation; Information technology; Iterative algorithms; Labeling; Lesions; Maximum likelihood estimation; Noise reduction; Parameter estimation; Positron emission tomography; EM; MAP-MRF; PET; segmentation;
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-2002-5
Electronic_ISBN :
978-1-4244-2003-2
DOI :
10.1109/ISBI.2008.4540917