Welcome

Summary form only given. Welcome to the 2005 IEEE International On-Line Testing Symposium! This year marks the 11th in a series of very productive technical meetings that started in Nice, France, in 1995. The On-Line Testing Workshop was created at a time when variety of applications of electronic systems was growing rapidly and system complexity was seeing a formidable increase, and hence, the need for increased protection against field failures. Since then, new nanometric technologies have increased the likelihood of faults, while many applications rely on integrated circuits to achieve safety, availability or security requirements. The design of modern electronics systems, therefore, needs efficient solutions combining high fault detection or tolerance with low cost and reduced time to market. The elevation of the workshop to a symposium in 2003 reflected both this trend and the recognition of this event as a major forum for sharing ideas and experiences with those working in this field. The submissions came this year from European, Asian, North and South American countries. We would like to thank all the members of the program committee for their hard work in selecting the 30 regular papers and 8 posters that appear in these proceedings. We would also like to thank our keynote speakers, special session and panel organizers and we hope that the attendees will find this technical program very stimulating.