DocumentCode :
1817508
Title :
Characterisation of an ultra-thin multilayer structure for spintronic materials
Author :
Chan, Kevin K F ; Hambe, Michael ; Petersen, Tim ; Ringer, Simon P. ; Cairney, Julie M.
Author_Institution :
Australian Key Centre for Microscopy & Microanalysis, Univ. of Sydney, Sydney, NSW, Australia
fYear :
2010
fDate :
22-26 Feb. 2010
Firstpage :
329
Lastpage :
332
Abstract :
We report on the synthesis of magnetic tunnel junctions using pulsed laser deposition. High resolution transmission electron microscope images of the multi-layer hetero-structures portray continuous thin films, with abrupt and flat interfaces of a few nanometers in thickness. Energy filtered transmission electron microscopy and energy dispersive X-ray spectroscopy line scans were used to assess elemental profiles and confirm the successful synthesis of an ultra-thin tunnel junction.
Keywords :
X-ray chemical analysis; bismuth compounds; ferromagnetic materials; lanthanum compounds; magnetic multilayers; magnetic thin films; pulsed laser deposition; strontium compounds; transmission electron microscopy; tunnelling magnetoresistance; La0.67Sr0.33MnO-SrRuO3-BiFeO3; SrTiO3; continuous thin films; elemental profiles; energy dispersive X-ray spectroscopy; energy filtered transmission electron microscopy; ferromagnetic materials; high resolution transmission electron microscopy; magnetic tunnel junctions; magnetoresistance; nanometer thickness; pulsed laser deposition; spintronic materials; ultrathin multilayer structure; Junctions; Magnetic force microscopy; Magnetic tunneling; Materials; Microscopy; magnetic tunnel junctions; pulsed laser depositon; spintronics; transmission electron microscope; tunnel magnetoresistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoscience and Nanotechnology (ICONN), 2010 International Conference on
Conference_Location :
Sydney, NSW
Print_ISBN :
978-1-4244-5261-3
Electronic_ISBN :
978-1-4244-5262-0
Type :
conf
DOI :
10.1109/ICONN.2010.6045255
Filename :
6045255
Link To Document :
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