Title : 
Characterisation of an ultra-thin multilayer structure for spintronic materials
         
        
            Author : 
Chan, Kevin K F ; Hambe, Michael ; Petersen, Tim ; Ringer, Simon P. ; Cairney, Julie M.
         
        
            Author_Institution : 
Australian Key Centre for Microscopy & Microanalysis, Univ. of Sydney, Sydney, NSW, Australia
         
        
        
        
        
        
            Abstract : 
We report on the synthesis of magnetic tunnel junctions using pulsed laser deposition. High resolution transmission electron microscope images of the multi-layer hetero-structures portray continuous thin films, with abrupt and flat interfaces of a few nanometers in thickness. Energy filtered transmission electron microscopy and energy dispersive X-ray spectroscopy line scans were used to assess elemental profiles and confirm the successful synthesis of an ultra-thin tunnel junction.
         
        
            Keywords : 
X-ray chemical analysis; bismuth compounds; ferromagnetic materials; lanthanum compounds; magnetic multilayers; magnetic thin films; pulsed laser deposition; strontium compounds; transmission electron microscopy; tunnelling magnetoresistance; La0.67Sr0.33MnO-SrRuO3-BiFeO3; SrTiO3; continuous thin films; elemental profiles; energy dispersive X-ray spectroscopy; energy filtered transmission electron microscopy; ferromagnetic materials; high resolution transmission electron microscopy; magnetic tunnel junctions; magnetoresistance; nanometer thickness; pulsed laser deposition; spintronic materials; ultrathin multilayer structure; Junctions; Magnetic force microscopy; Magnetic tunneling; Materials; Microscopy; magnetic tunnel junctions; pulsed laser depositon; spintronics; transmission electron microscope; tunnel magnetoresistance;
         
        
        
        
            Conference_Titel : 
Nanoscience and Nanotechnology (ICONN), 2010 International Conference on
         
        
            Conference_Location : 
Sydney, NSW
         
        
            Print_ISBN : 
978-1-4244-5261-3
         
        
            Electronic_ISBN : 
978-1-4244-5262-0
         
        
        
            DOI : 
10.1109/ICONN.2010.6045255