DocumentCode
1817631
Title
Computation of exact random pattern detection probability
Author
Farhat, Hassan ; Lioy, Antonio ; Poncino, Massimo
Author_Institution
Math. & Comput. Sci., Nebraska Univ., Omaha, NE, USA
fYear
1993
fDate
9-12 May 1993
Abstract
An exact method for computing the fault detection probability of pseudorandom patterns is presented. The method is based on the global difference function of the faults. Proper manipulation of the Boolean function of a circuit can lead to the fast computation of its exact full detectability profile, thus avoiding the computational burden of exhaustive simulation. This method, besides strongly outperforming exhaustive fault simulation, applies to real circuits, such as many of those in the ISCAS´85 and ISCAS´89 benchmark sets
Keywords
fault diagnosis; ATPG; BIST; Boolean function; DFT; algorithm; binary decision diagrams; exact random pattern detection probability; fast computation; fault detection; global difference function; probability; pseudorandom patterns; real circuits; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Electrical fault detection; Fault detection; Probability; Test pattern generators; Upper bound;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 1993., Proceedings of the IEEE 1993
Conference_Location
San Diego, CA
Print_ISBN
0-7803-0826-3
Type
conf
DOI
10.1109/CICC.1993.590784
Filename
590784
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