Title :
Heavy ion effects on configuration logic of Virtex FPGAs
Author :
Alderighi, M. ; Candelori, A. ; Casini, F. ; Angelo, S.D. ; Mancini, M. ; Paccagnella, A. ; Pastore, S. ; Sechi, G.R.
Author_Institution :
IASF, INAF, Padova, Italy
Abstract :
A heavy ion radiation test has been performed to evaluate the SEU sensitivity of Virtex devices. Differently from previous radiation tests, the one here described specifically addresses configuration logic. Previously unreported failure mechanisms have been observed and classified and their corresponding cross sections measured.
Keywords :
failure analysis; field programmable gate arrays; logic testing; radiation effects; SEU sensitivity; Virtex devices; configuration logic; failure mechanisms; field programmable gate arrays; heavy ion radiation test; single event upsets; Communication system control; Failure analysis; Field programmable gate arrays; Hardware; Logic devices; Logic testing; Performance evaluation; Single event upset; System testing; Universal Serial Bus;
Conference_Titel :
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN :
0-7695-2406-0
DOI :
10.1109/IOLTS.2005.31
