Title :
Optical surface profilometry and AFM of Orb weaver spider silks
Author :
Kane, D.M. ; Staib, G.R. ; Naidoo, N. ; Joyce, A.M. ; Rabeau, J.R. ; Herberstein, M.E.
Author_Institution :
Dept. of Phys., Macquarie Univ., Sydney, NSW, Australia
Abstract :
AFM (Atomic Force Microscopy) and OSP (Optical Surface Profiling) have been applied to measure the surfaces of spider silks - both radials and capture silks- at the nano- and micro-scale.
Keywords :
atomic force microscopy; nanostructured materials; surface roughness; AFM; OSP; Orb weaver spider silks; atomic force microscopy; microscale topology; nanoscale roughness; optical surface profilometry; Optical fibers; Optical interferometry; Optical scattering; Optical surface waves; Rough surfaces; Surface roughness; AFM; microscale topology; nanoscale roughness; optical surface profile; spider silk; surface topology;
Conference_Titel :
Nanoscience and Nanotechnology (ICONN), 2010 International Conference on
Conference_Location :
Sydney, NSW
Print_ISBN :
978-1-4244-5261-3
Electronic_ISBN :
978-1-4244-5262-0
DOI :
10.1109/ICONN.2010.6045264
