DocumentCode :
1817741
Title :
High efficiency silicon x-ray detectors
Author :
Tull, C.R. ; Iwanczyk, J.S. ; Patt, B.E. ; Barkan, S. ; Feng, L.
Author_Institution :
Photon Imaging. Inc, Northridge, CA, USA
Volume :
2
fYear :
2003
fDate :
19-25 Oct. 2003
Firstpage :
1341
Abstract :
Thick silicon multi-cathode detectors (SMCD) for high efficiency x-ray detection have been designed, fabricated and tested. These thick detectors (up to 1.5 mm thick) extend the practical x-ray detection range from the current level of ∼20 keV, up to ∼40 keV, while still maintaining the low noise and high count rate performance of the thinner (∼0.3 mm) SMCD technology. The increase in x-ray detection efficiency at higher energies will have a significant impact on practical uses of these detectors in a wide variety of x-ray fluorescence (XRF) applications. In addition to increasing the detection efficiency for x-rays, the thick silicon detectors will offer improved efficiency for high energy electrons, alphas and other light particles in nuclear physics and astrophysics applications. Very high resistivity float zone material was used for the substrates to minimize the operating voltages required. Multi-guard ring structures were designed to prevent the premature breakdown of the devices at the voltages required to fully deplete the thick detectors. We have measured 172 eV and 158 eV FWHM energy resolution at 5.9 keV (at 4 μs and 12 μs peaking time, respectively, -55°C) on 1 mm thick prototype detectors. Spectral performance, energy resolution, efficiency and count rate performance are presented.
Keywords :
X-ray detection; silicon radiation detectors; 0.3 mm; 1.5 mm; 12 ms; 20 keV; 4 ms; 40 keV; Si; high efficiency Si x-ray detectors; high resistivity float zone material; multi-cathode detectors; multi-guard ring structures; x-ray fluorescence; Breakdown voltage; Electrons; Energy resolution; Fluorescence; Noise level; Nuclear physics; Silicon; Testing; X-ray detection; X-ray detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2003 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-8257-9
Type :
conf
DOI :
10.1109/NSSMIC.2003.1351942
Filename :
1351942
Link To Document :
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