DocumentCode :
1817757
Title :
A new evaluation of the brain parenchymal fraction: Application in multiple sclerosis longitudinal studies
Author :
Souplet, J.C. ; Lebrun, C. ; Ayache, N. ; Malandain, G.
Author_Institution :
Asclepios team, INRIA, Sophia-Antipolis
fYear :
2008
fDate :
14-17 May 2008
Firstpage :
65
Lastpage :
68
Abstract :
In multiple sclerosis (MS) research, burden of disease and treatments efficacy are mainly evaluated with lesion load and atrophy. The former being poorly correlated with patient´s handicap, it is of interest to evaluate accurately the latter. A lot of methods to measure the brain atrophy are available in the literature. The brain parenchymal fraction (BPF) is one of these methods. It needs a precise segmentation of the brain and of the cerebro-spinal fluid. However, artefacts like partial volume effects (PVE) can impair this classification. According to some articles, the BPF may also be less precise in longitudinal studies. To address these points, this article proposes a new method to evaluate the BPF which is based on an expectation-minimization framework taking into consideration the PVE. Modifications of the workflow are also proposed to improve its reliability in longitudinal study. Experiments have been conducted on simulated pathological images that validate the different measures.
Keywords :
biomedical MRI; brain; diseases; image segmentation; medical image processing; biomedical image processing; brain parenchymal fraction; brain segmentation; cerebro-spinal fluid; expectation-minimization framework; magnetic resonance imaging; multiple sclerosis; partial volume effects; simulated pathological images; Atrophy; Band pass filters; Biomedical measurements; Gaussian processes; Image segmentation; Lesions; Magnetic resonance imaging; Multiple sclerosis; Skull; Volume measurement; Atrophy; Biomedical Image Processing; Magnetic Resonance Imaging; Multiple Sclerosis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-2002-5
Electronic_ISBN :
978-1-4244-2003-2
Type :
conf
DOI :
10.1109/ISBI.2008.4540933
Filename :
4540933
Link To Document :
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