Title :
Trends and trade-offs in designing highly robust throughput computing oriented chips and systems
Author :
Parulkar, Ishwar ; Cypher, Robert
Abstract :
Silicon technology trends of 65nm technology and architectural trends of the next generation of processors, chip-sets and systems are driving new design paradigms and shifts in the approaches towards robust system design. This paper addresses the convergence of these trends in designing the next generation of highly reliable systems at Sun Microsystems.
Keywords :
combinational circuits; digital systems; flip-flops; integrated circuit design; integrated circuit reliability; logic design; microprocessor chips; Sun Microsystems; combinational circuits; computing oriented chips; digital systems; flip-flops; integrated circuit design; integrated circuit reliability; logic design; microprocessor chips; silicon technology; Availability; Error correction codes; Logic; Microprocessors; Protection; Random access memory; Robustness; Silicon; Sun; Throughput;
Conference_Titel :
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN :
0-7695-2406-0
DOI :
10.1109/IOLTS.2005.68
