Title :
Simulation and mitigation of single event effects
Author :
Anghel, Lorena ; Nicolaidis, Michael
Abstract :
This special session includes a presentation on nuclear codes used to determine a data-base of secondary ion species and their energies produced by the neutron-silicon and neutron-oxygen interactions, a presentation on FIT estimation tools using the secondary ions data-base created by the former codes and a presentation on design techniques suitable for mitigating the effects of ionising particles on modern nanometric designs.
Keywords :
monolithic integrated circuits; nanoelectronics; neutron effects; FIT estimation tools; ionising particle effects; monolithic integrated circuits; nanoelectronics; nanometric designs; neutron effects; neutron-oxygen interactions; neutron-silicon interactions; nuclear codes; secondary ion species; secondary ions data-base; single event effects; Discrete event simulation; Testing;
Conference_Titel :
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN :
0-7695-2406-0
DOI :
10.1109/IOLTS.2005.65
