DocumentCode
1817790
Title
Simulation and mitigation of single event effects
Author
Anghel, Lorena ; Nicolaidis, Michael
fYear
2005
fDate
6-8 July 2005
Firstpage
81
Abstract
This special session includes a presentation on nuclear codes used to determine a data-base of secondary ion species and their energies produced by the neutron-silicon and neutron-oxygen interactions, a presentation on FIT estimation tools using the secondary ions data-base created by the former codes and a presentation on design techniques suitable for mitigating the effects of ionising particles on modern nanometric designs.
Keywords
monolithic integrated circuits; nanoelectronics; neutron effects; FIT estimation tools; ionising particle effects; monolithic integrated circuits; nanoelectronics; nanometric designs; neutron effects; neutron-oxygen interactions; neutron-silicon interactions; nuclear codes; secondary ion species; secondary ions data-base; single event effects; Discrete event simulation; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN
0-7695-2406-0
Type
conf
DOI
10.1109/IOLTS.2005.65
Filename
1498134
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