DocumentCode
1817807
Title
Use of nuclear codes for neutron-induced nuclear reactions in microelectronics
Author
Wrobel, Frédéric
Author_Institution
Univ. de Nice-Sophia Antipolis, France
fYear
2005
fDate
6-8 July 2005
Firstpage
82
Lastpage
86
Abstract
Neutron induced nuclear reactions are known to be responsible for triggering various failures in microelectronics. Nuclear codes are very useful tools, which allow estimating the production of the secondary ions and finally the way that the component is ionized. In this work we propose to give an overview of the kind of available nuclear codes. We distinguish determinist codes from Monte Carlo ones and explained why these latter are the best adapted for the study of neutron induced failures in microcircuits.
Keywords
Monte Carlo methods; failure analysis; integrated circuit reliability; integrated circuit testing; neutron effects; Monte Carlo codes; failure analysis; integrated circuit reliability; integrated circuit testing; microcircuit failure; microelectronics; neutron effects; neutron-induced nuclear reactions; nuclear codes; Atmosphere; Charge carrier processes; Microelectronics; Monte Carlo methods; Neutrons; Nuclear power generation; Production; Radiation effects; Silicon; Single event upset;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN
0-7695-2406-0
Type
conf
DOI
10.1109/IOLTS.2005.69
Filename
1498135
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