• DocumentCode
    1817831
  • Title

    A review of DASIE code family: contribution to SEU/MBU understanding

  • Author

    Hubert, G. ; Buard, N. ; Weulersse, C. ; Carriere, T. ; Palau, M.-C. ; Palau, J.-M. ; Lambert, D. ; Baggio, J. ; Wrobel, F. ; Saigne, F. ; Gaillard, R.

  • Author_Institution
    Corporate Res. Center, EADS, Suresnes, France
  • fYear
    2005
  • fDate
    6-8 July 2005
  • Firstpage
    87
  • Lastpage
    94
  • Abstract
    DASIE (the detailed analysis of secondary ion effect) is the name of a code family dedicated to the SEE rate prediction. This paper presents a review of DASIE code family and its contributions to SEU (single event upset) and MBU (multiple bit upset) understanding.
  • Keywords
    SRAM chips; integrated circuit testing; radiation effects; DASIE code family; SEE rate prediction; SRAM chips; integrated circuit testing; multiple bit upset; radiation effects; secondary ion effects; single event upset; Aerospace electronics; Databases; Energy exchange; Error analysis; Neutrons; Nuclear power generation; Protons; Silicon; Single event upset; Transportation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
  • Print_ISBN
    0-7695-2406-0
  • Type

    conf

  • DOI
    10.1109/IOLTS.2005.12
  • Filename
    1498136
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1817831