A modified histogram approach for accurate self-characterization of analog-to-digital converters

Author

Parthasarathy, Kumar L. ; Jin, Le ; Chen, Degang ; Geiger, Randall

Author_Institution

Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA

Volume

2

fYear

2002

fDate

2002

Abstract

A new approach for measuring the INL and DNL of an A/D converter that uses histogram information is introduced. Unlike most existing algorithms, this method does not require the generation of accurate input signals so offers potential for use in a Built-in Self-Test (BIST) environment. Multiple inputs are presented to the device under test and the histograms obtained at the output are analyzed to characterize both the device and the nonlinear input. Preliminary simulation results for a 10-bit flash ADC suggest this approach can measure INL to the 0.5LSB level with a low spectral purity input signal that is linear to less than the 4-bit level

Keywords

analogue-digital conversion; automatic testing; built-in self test; integrated circuit testing; 10 bit; ADC self-characterization; BIST environment; DNL measurement; INL measurement; analog circuits; analog-to-digital converters; built-in self-test environment; flash ADC; mixed-signal circuits; modified histogram approach; multiple inputs; Analog-digital conversion; Built-in self-test; Circuit testing; Costs; Histograms; Integrated circuit testing; Manufacturing; Production; Signal generators; Silicon;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on

Conference_Location

Phoenix-Scottsdale, AZ

Print_ISBN

0-7803-7448-7

Type

conf

DOI

10.1109/ISCAS.2002.1011003

Filename

1011003