Does it mean less testing for self calibrating design?

In this presentation, we examine several cases of self compensating design and self calibrating design. We show that these kinds of designs have high degree of circuit level redundancy and it is very difficult to test for the various redundant elements, which are not necessarily activated during the test procedures or conditions. DFT must be introduced to allow for additional controllability and observability and test procedures adjusted covering for these elements. Otherwise, if these compensating elements have a defect or they are way off on the scale of process variation, the design may not be self compensating after all. We also show that the calibration circuits themselves also have to be tested.