Title :
Introduction to the special session on secure implementations
Author_Institution :
TIMA Lab., Grenoble, France
Abstract :
This paper briefly introduces online testing and its evolution towards very sub micron technologies. How secure circuit designers and online testing experts collaboration can help detect online the occurrence of natural faults that may be used as a basis to counter fault-based attacks taking into account the particular needs of secure application.
Keywords :
cryptography; fault diagnosis; integrated circuit design; integrated circuit testing; fault-based attacks; natural faults; online testing; secure application; secure circuit; secure implementations; very sub micron technologies; Application software; Circuit faults; Computer hacking; Electrical fault detection; Fault detection; Power system security; Protection; Space technology; Special issues and sections; Testing;
Conference_Titel :
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN :
0-7695-2406-0
DOI :
10.1109/IOLTS.2005.40
