• DocumentCode
    1818058
  • Title

    Automated Insect Identification through Concatenated Histograms of Local Appearance Features

  • Author

    Larios, N. ; Deng, H. ; Zhang, W. ; Sarpola, M. ; Yuen, J. ; Paasch, R. ; Moldenke, A. ; Lytle, D.A. ; Correa, S.R. ; Mortensen, E. ; Shapiro, L.G. ; Dietterich, T.G.

  • Author_Institution
    Washington Univ., Seattle, WA
  • fYear
    2007
  • fDate
    Feb. 2007
  • Firstpage
    26
  • Lastpage
    26
  • Abstract
    This paper describes a fully automated stone fly-larvae classification system using a local features approach. It compares the three region detectors employed by the system: the Hessian-affine detector, the Kadir entropy detector and a new detector we have developed called the principal curvature based region detector (PCBR). It introduces a concatenated feature histogram (CFH) methodology that uses histograms of local region descriptors as feature vectors for classification and compares the results using this methodology to that of Opelt [Opelt, A, et.al., 2006.] on three stonefly identification tasks. Our results indicate that the PCBR detector outperforms the other two detectors on the most difficult discrimination task and that the use of all three detectors outperforms any other configuration. The CFH methodology also outperforms the Opelt methodology in these tasks
  • Keywords
    biology computing; feature extraction; image classification; zoology; CFH methodology; Hessian affine detector; Kadir entropy detector; PCBR detector; automated insect identification; classification system; concatenated feature histogram; discrimination task; feature vectors; local appearance feature histograms; local region descriptors; principal curvature based region detector; stone fly larvae; Computer vision; Concatenated codes; Detectors; Entropy; Histograms; Insects; Pediatrics; Thermal pollution; Water pollution; Water resources;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Computer Vision, 2007. WACV '07. IEEE Workshop on
  • Conference_Location
    Austin, TX
  • ISSN
    1550-5790
  • Print_ISBN
    0-7695-2794-9
  • Electronic_ISBN
    1550-5790
  • Type

    conf

  • DOI
    10.1109/WACV.2007.13
  • Filename
    4118755