• DocumentCode
    1818080
  • Title

    On-line testing of globally asynchronous circuits

  • Author

    Shang, D. ; Bystrov, A. ; Yakovlev, A. ; Koppad, D.

  • Author_Institution
    Sch. of EECE, Univ. of Newcastle upon Tyne, UK
  • fYear
    2005
  • fDate
    6-8 July 2005
  • Firstpage
    135
  • Lastpage
    140
  • Abstract
    The problem of on-line testing of asynchronous circuits is analyzed, several infrastructures are proposed and a self-checking tree checker is designed. The checker uses on-demand self-test, which reduces power consumption and guarantees bounded self-test period. Objects under test are tested by observing protocols at their primary inputs and outputs. The checker does not slow down the functional system, as it only samples the signals. The protocols are checked by identifying enabled and refused signal transitions in each state of the system. The fault coverage of internal faults of the checker is calculated. Simulation results are included.
  • Keywords
    asynchronous circuits; automatic testing; logic testing; fault coverage; globally asynchronous circuits; internal faults; on-demand self-test; on-line testing; power consumption; self-checking tree checker; signal transitions; Asynchronous circuits; Automatic testing; Built-in self-test; Circuit analysis; Circuit faults; Circuit testing; Delay; Latches; Protocols; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
  • Print_ISBN
    0-7695-2406-0
  • Type

    conf

  • DOI
    10.1109/IOLTS.2005.53
  • Filename
    1498147