DocumentCode
1818135
Title
A statistical learning appproach to vertebra detection and segmentation from spinal MRI
Author
Huang, Szu-Hao ; Lai, Shang-Hong ; Novak, Carol L.
Author_Institution
Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu
fYear
2008
fDate
14-17 May 2008
Firstpage
125
Lastpage
128
Abstract
Automatically extracting vertebra regions from a spinal magnetic resonance image is normally required as the first step to an intelligent spinal MR image diagnosis system. In this work, we develop a fully automatic vertebra detection and segmentation method. Our system consists of three stages; namely, AdaBoost-based vertebra detection, detection refinement via robust curve fitting, and vertebra segmentation by an iterative normalized cut algorithm. We proposed an efficient and effective vertebra detector, which is trained by the improved AdaBoost algorithm, to locate the initial vertebra positions. Then, a robust estimation procedure is applied to fit all the vertebrae as a polynomial spinal curve to refine the vertebra detection results. Finally, an iterative segmentation algorithm based on normalized-cut energy minimization is applied to extract the precise vertebra regions from the detected windows. The experimental results show our system can achieve high accuracy on a number of testing 3D spinal MRI data sets.
Keywords
biomedical MRI; image segmentation; learning (artificial intelligence); medical image processing; neurophysiology; statistical analysis; AdaBoost algorithm; iterative segmentation algorithm; normalized-cut energy minimization; polynomial spinal curve; spinal MRI; statistical learning; vertebra detection; vertebra segmentation; Curve fitting; Detectors; Image segmentation; Iterative algorithms; Magnetic resonance; Magnetic resonance imaging; Polynomials; Robustness; Spine; Statistical learning; AdaBoost; Normalized-cut; RANSAC; Segmentation; Vertebra Detection; spinal MR image;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
Conference_Location
Paris
Print_ISBN
978-1-4244-2002-5
Electronic_ISBN
978-1-4244-2003-2
Type
conf
DOI
10.1109/ISBI.2008.4540948
Filename
4540948
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