DocumentCode
1818206
Title
Synthesis for testability: circuits derived from ordered Kronecker functional decision diagrams
Author
Becker, Bernd ; Drechsler, Rolf
Author_Institution
Dept. of Comput. Sci., Frankfurt Univ., Germany
fYear
1995
fDate
6-9 Mar 1995
Firstpage
592
Abstract
Summary form only given. Testability properties of circuits derived from Ordered Kronecker Functional Decision Diagrams (OKFDDs) are studied with respect to the Stuck-At Fault Model (SAFM) and the Cellular Fault Model (CFM). The computation of complete test sets and of all occurring redundancies can be done easily and efficiently and circuits with high testability can be obtained
Keywords
combinational circuits; design for testability; fault diagnosis; logic design; logic testing; redundancy; cellular fault model; ordered Kronecker functional decision diagrams; redundancies; stuck-at fault model; synthesis for testability; test sets; Carbon capture and storage; Circuit faults; Circuit synthesis; Circuit testing; Combinational circuits; Controllability; Fault location; Inverters; Libraries; Redundancy;
fLanguage
English
Publisher
ieee
Conference_Titel
European Design and Test Conference, 1995. ED&TC 1995, Proceedings.
Conference_Location
Paris
Print_ISBN
0-8186-7039-8
Type
conf
DOI
10.1109/EDTC.1995.470336
Filename
470336
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