DocumentCode :
1818213
Title :
Process variation tolerant online current monitor for robust systems
Author :
Chen, Qikai ; Mukhopadhyay, Saibal ; Mahmoodi, Hamid ; Roy, Kaushik
Author_Institution :
Purdue Univ., West Lafayette, IN, USA
fYear :
2005
fDate :
6-8 July 2005
Firstpage :
171
Lastpage :
176
Abstract :
Large inter-die and intra-die process variations result in significant uncertainty in delay of circuits. Large delay variations may lead to parametric/functional failures. In this paper we propose a leakage-variation-tolerant online current monitor, namely leakage canceling current sensor, to detect completion of operations in logic blocks. The current monitor is applied to self timed logic to design process variation tolerant circuits. It is observed that, for self-timed circuits, the probability of functional failures can be reduced by 50% with no performance degradation and with same power consumption.
Keywords :
delays; electric current measurement; fault tolerance; leakage currents; logic circuits; logic design; circuit delays; delay variations; leakage canceling current sensor; leakage-variation-tolerant online current monitor; logic blocks; parametric/functional failures; process variation; robust systems; self timed logic; Condition monitoring; Degradation; Delay; Energy consumption; Leak detection; Logic circuits; Logic design; Process design; Robustness; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN :
0-7695-2406-0
Type :
conf
DOI :
10.1109/IOLTS.2005.57
Filename :
1498152
Link To Document :
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