• DocumentCode
    1818213
  • Title

    Process variation tolerant online current monitor for robust systems

  • Author

    Chen, Qikai ; Mukhopadhyay, Saibal ; Mahmoodi, Hamid ; Roy, Kaushik

  • Author_Institution
    Purdue Univ., West Lafayette, IN, USA
  • fYear
    2005
  • fDate
    6-8 July 2005
  • Firstpage
    171
  • Lastpage
    176
  • Abstract
    Large inter-die and intra-die process variations result in significant uncertainty in delay of circuits. Large delay variations may lead to parametric/functional failures. In this paper we propose a leakage-variation-tolerant online current monitor, namely leakage canceling current sensor, to detect completion of operations in logic blocks. The current monitor is applied to self timed logic to design process variation tolerant circuits. It is observed that, for self-timed circuits, the probability of functional failures can be reduced by 50% with no performance degradation and with same power consumption.
  • Keywords
    delays; electric current measurement; fault tolerance; leakage currents; logic circuits; logic design; circuit delays; delay variations; leakage canceling current sensor; leakage-variation-tolerant online current monitor; logic blocks; parametric/functional failures; process variation; robust systems; self timed logic; Condition monitoring; Degradation; Delay; Energy consumption; Leak detection; Logic circuits; Logic design; Process design; Robustness; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
  • Print_ISBN
    0-7695-2406-0
  • Type

    conf

  • DOI
    10.1109/IOLTS.2005.57
  • Filename
    1498152