• DocumentCode
    1818257
  • Title

    Benchmarking R&D in the semiconductor industry using DEA

  • Author

    Neshati, Ramin

  • Author_Institution
    Dept. of Eng. & Technol. Manage., Portland State Univ., Portland, OR, USA
  • fYear
    2013
  • fDate
    July 28 2013-Aug. 1 2013
  • Firstpage
    2749
  • Lastpage
    2756
  • Abstract
    Leading firms in the semiconductor manufacturing industry invest significant capital outlays and other resources in Research and Development (R&D) to attain and retain competitive advantage over their rivals. How effectives and efficient are such massive investments, and do they result in superior outputs that disproportionately enhance the capabilities of the firm for unsurpassed competitive advantage? A review of the academic literature reveals that the R&D efficiency of semiconductor manufacturing firms deserves more attention by researchers. Using Data Envelopment Analysis (DEA), a comparative benchmark of the efficiency of R&D in semiconductor manufacturing is conducted among the industry´s leading firms. Managers in ten semiconductor manufacturing firms are interviewed using a survey instrument to collect data on the relevant measures of R&D productivity. The dataset is analyzed using an output-oriented DEA model with Variable Returns to Scale (VRS). The findings are consistent with expectations: firms that invest in R&D through capital outlays, human resources and development time lead the industry in the generation of intellectual assets and reap the benefits that accrue from such investments. Managerial implications are discussed along with suggestions for further study, including refining the proposed model to yield additional output measures, comparing the efficiency of firms across multiple generations of semiconductor manufacturing process technologies, and updating the model with other measures or parameters of semiconductor manufacturing efficiency based on expert knowledge.
  • Keywords
    benchmark testing; data envelopment analysis; investment; knowledge management; productivity; research and development; semiconductor industry; DEA; R and D efficiency; R and D productivity; benchmarking; capital outlays; data envelopment analysis; expert knowledge; human resources; intellectual assets; investment; research and development; semiconductor manufacturing industry; variable returns to scale; Investment; Manufacturing processes; Patents; Semiconductor device measurement; Semiconductor device modeling; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Technology Management in the IT-Driven Services (PICMET), 2013 Proceedings of PICMET '13:
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • Filename
    6641613