DocumentCode :
1818394
Title :
On the proposition of an EMI-based fault injection approach
Author :
Vargas, F. ; Cavalcante, D.L. ; Gatti, E. ; Prestes, D. ; Lupi, D.
Author_Institution :
Dept. of Electr. Eng., Catholic Univ. - PUCRS, Porto Alegre, Brazil
fYear :
2005
fDate :
6-8 July 2005
Firstpage :
207
Lastpage :
208
Abstract :
The following paper describes a new approach to perform physical fault injection in electronic systems. The approach is settled around a gigahertz transverse electromagnetic (GTEM) cell, which is employed in a controlled process to inject faults in the system under test (SUT). The assumed fault models are delay faults (provoked by signal propagation delay increase in SUT critical paths, thus resulting in de-synchronization between the computed data to be latched and the clock signal) and bit-flips (i.e., corruption of static data stored in memory elements).
Keywords :
electromagnetic interference; failure analysis; fault tolerance; EMI-based fault injection; GTEM cell; SUT; bit-flips; delay faults; electronic systems; fault model; gigahertz transverse electromagnetic cell; signal propagation delay; system under test; Amplitude modulation; Electromagnetic compatibility; Electronic equipment testing; Fault detection; Frequency; Microcomputers; Process control; Propagation delay; RF signals; TEM cells;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN :
0-7695-2406-0
Type :
conf
DOI :
10.1109/IOLTS.2005.47
Filename :
1498162
Link To Document :
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