DocumentCode
1818506
Title
Advanced level-set based multiple-cell segmentation and tracking in time-lapse fluorescence microscopy images
Author
Dzyubachyk, Oleh ; Niessen, Wiro ; Meijering, Erik
Author_Institution
Biomed. Imaging Group, Erasmus MC - Univ. Med. Center Rotterdam, Rotterdam
fYear
2008
fDate
14-17 May 2008
Firstpage
185
Lastpage
188
Abstract
Segmentation and tracking of cells in fluorescence microscopy image sequences is an important task in many biological studies into cell migration as well as intracellular dynamics. The growing size and complexity of biological image data sets precludes manual analysis, and calls for increasingly advanced automatic algorithms that are generic enough to be easily tunable to different applications, yet robust enough to deal with different cell types and strongly varying imaging conditions. Active-contour based algorithms have proven to be very suitable for this purpose but still suffer from several shortcomings that limit their segmentation accuracy and tracking robustness. In addition, these algorithms are generally rather computationally expensive. In this paper, we present an advanced level-set based multiple-cell segmentation and tracking algorithm, which implements seven modifications compared to earlier algorithms that considerably improve its performance. Preliminary experiments on three different time-lapse fluorescence microscopy images demonstrate the potential of the new algorithm.
Keywords
biomedical optical imaging; cellular biophysics; fluorescence; image segmentation; medical image processing; active-contour based algorithms; multiple cell segmentation; time-lapse fluorescence microscopy; Algorithm design and analysis; Biomedical imaging; Cells (biology); Fluorescence; Image analysis; Image segmentation; Image sequences; Level set; Microscopy; Robustness; Fluorescence microscopy; Radon transform; cell segmentation; cell tracking; level sets;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
Conference_Location
Paris
Print_ISBN
978-1-4244-2002-5
Electronic_ISBN
978-1-4244-2003-2
Type
conf
DOI
10.1109/ISBI.2008.4540963
Filename
4540963
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