• DocumentCode
    1818551
  • Title

    Continuous image representations avoid the histogram binning problem in mutual information based image registration

  • Author

    Rajwade, Ajit ; Banerjee, Arunava ; Rangarajan, Anand

  • Author_Institution
    Dept. of CISE, Florida Univ., Gainesville, FL
  • fYear
    2006
  • fDate
    6-9 April 2006
  • Firstpage
    840
  • Lastpage
    843
  • Abstract
    Mutual information (MI) based image-registration methods that use histograms are known to suffer from the so-called binning problem, caused by the absence of a principled technique for choosing the "optimal" number of bins to calculate the joint or marginal distributions. In this paper, we show that foregoing the notion of an image as a set of discrete pixel locations, and adopting a continuous representation is the solution to this problem. A new technique to calculate joint image histograms is proposed, which makes use of such a continuous representation. We report results on affine registration of a pair of 2D medical images under high noise, and demonstrate the smoothness of various information-theoretic similarity measures such as joint entropy (JE) or MI w.r.t. the transformation, when our proposed technique (referred to as the "robust histogram") is adopted to compute the required probability distributions
  • Keywords
    affine transforms; biomedical MRI; entropy; image registration; image representation; medical image processing; statistical distributions; 2D medical images; MR imaging; affine registration; continuous image representation; discrete pixel locations; high noise; histogram binning problem; image registration; information-theoretic similarity measures; joint entropy; mutual information; probability distributions; robust histogram; Biomedical imaging; Distributed computing; Entropy; Histograms; Image registration; Image representation; Mutual information; Noise measurement; Noise robustness; Pixel;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: Nano to Macro, 2006. 3rd IEEE International Symposium on
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    0-7803-9576-X
  • Type

    conf

  • DOI
    10.1109/ISBI.2006.1625049
  • Filename
    1625049