DocumentCode
1818657
Title
A new approach for early dependability evaluation based on formal property checking and controlled mutations
Author
Leveugle, R.
Author_Institution
TIMA Lab., Grenoble, France
fYear
2005
fDate
6-8 July 2005
Firstpage
260
Lastpage
265
Abstract
The interest for early analyses of the functional impact of faults in a circuit is growing, due to the increasing probability of transient faults. However, experiments are often very long, especially when spatial and temporal multiplicity has to be taken into account in the fault model. Formal property checking is an appealing approach to perform comprehensive functional validations but is intended to validate properties only in nominal operation, not after a fault has occurred. This paper proposes a new approach combining formal property checking and the generation of specific circuit mutants to achieve efficient early identification of unacceptable effects of multiple faults.
Keywords
fault simulation; formal verification; network analysis; performance evaluation; transient analysis; controlled mutations; early dependability evaluation; fault impact; formal property checking; spatial multiplicity; temporal multiplicity; transient faults; Analytical models; CMOS technology; Circuit faults; Circuit simulation; Emulation; Genetic mutations; Instruments; Robustness; Single event upset; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN
0-7695-2406-0
Type
conf
DOI
10.1109/IOLTS.2005.8
Filename
1498171
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