• DocumentCode
    1818657
  • Title

    A new approach for early dependability evaluation based on formal property checking and controlled mutations

  • Author

    Leveugle, R.

  • Author_Institution
    TIMA Lab., Grenoble, France
  • fYear
    2005
  • fDate
    6-8 July 2005
  • Firstpage
    260
  • Lastpage
    265
  • Abstract
    The interest for early analyses of the functional impact of faults in a circuit is growing, due to the increasing probability of transient faults. However, experiments are often very long, especially when spatial and temporal multiplicity has to be taken into account in the fault model. Formal property checking is an appealing approach to perform comprehensive functional validations but is intended to validate properties only in nominal operation, not after a fault has occurred. This paper proposes a new approach combining formal property checking and the generation of specific circuit mutants to achieve efficient early identification of unacceptable effects of multiple faults.
  • Keywords
    fault simulation; formal verification; network analysis; performance evaluation; transient analysis; controlled mutations; early dependability evaluation; fault impact; formal property checking; spatial multiplicity; temporal multiplicity; transient faults; Analytical models; CMOS technology; Circuit faults; Circuit simulation; Emulation; Genetic mutations; Instruments; Robustness; Single event upset; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
  • Print_ISBN
    0-7695-2406-0
  • Type

    conf

  • DOI
    10.1109/IOLTS.2005.8
  • Filename
    1498171