• DocumentCode
    1818711
  • Title

    Integrated constant-fraction discriminator shaping techniques for the PHENIX lead-scintillator calorimeter

  • Author

    Jackson, R. Gentry ; Blalock, T. Vaughn ; Simpson, Michael L. ; Wintenberg, A.L. ; Young, Glenn R.

  • Author_Institution
    Tennessee Univ., Knoxville, TN, USA
  • Volume
    1
  • fYear
    1996
  • fDate
    2-9 Nov 1996
  • Firstpage
    51
  • Abstract
    The suitability of several on-chip constant-fraction discriminator (CFD) shaping methods for use in the multichannel PHENIX Lead-Scintillator detector has been investigated. Three CFD circuits utilizing a distributed R-C delay-line, a lumped-element R-C delay-line and the Nowlin shaping method have been realized in a standard 1.2-μm n-well CMOS process. A CFD using ideal delay-line shaping was also studied for comparison. Time walk for 5 ns risetime input signals over a dynamic range of -2 V to -20 mV was less than ±175 ps, ±150 ps, ±150, and ±185 ps while worst case rms timing jitter measured 85 ps, 90 ps, 100 ps, and 65 ps, respectively, for the four methods mentioned above. Area requirements for the three candidate methods tested including the fraction circuit were 172 μ×70 μ, 160 μ×65 μ, 179 μ× 53 μ, respectively. The fraction circuit area for the external delay-line circuit was 67 μ×65 μ. Each shaping method studied consumed no power from the dc supply
  • Keywords
    CMOS integrated circuits; delay lines; detector circuits; digital-analogue conversion; discriminators; jitter; mixed analogue-digital integrated circuits; nuclear electronics; pulse shaping circuits; solid scintillation detectors; CMOS process; Nowlin shaping method; PHENIX lead-scintillator calorimeter; delay-line shaping; distributed R-C delay-line; integrated constant-fraction discriminator shaping techniques; lumped-element R-C delay-line; multichannel PHENIX Lead-Scintillator detector; on-chip constant-fraction discriminator shaping methods; timing jitter; Circuit testing; Computational fluid dynamics; Delay; Detectors; Dynamic range; Integrated circuit measurements; Laboratories; Noise shaping; Time measurement; Timing jitter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-3534-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1996.590890
  • Filename
    590890