• DocumentCode
    1818790
  • Title

    Overview of soft errors issues in aerospace systems

  • Author

    Boléat, Christian ; Colas, Gérard

  • Author_Institution
    Astrium EADS, Toulouse, France
  • fYear
    2005
  • fDate
    6-8 July 2005
  • Firstpage
    299
  • Lastpage
    302
  • Abstract
    Semiconductor manufacturing has been a major contributor to the industrial developments in the past decades. Nevertheless, the introduction, in the last decade, of new microprocessor architectures has limited this contribution in the space/avionics domain. One reason for the absence of the most recent and powerful processors in these embedded systems is mainly due to the severe constraints found in these harsh environments: the high risk of errors and failures induced by radiations. Indeed, for processor manufacturers accounting for such specific constraints would not pay of with respect to the main market of ground-level embedded systems.
  • Keywords
    avionics; embedded systems; radiation effects; semiconductor device manufacture; semiconductor device testing; aerospace systems; embedded systems; harsh environments; microprocessor architectures; semiconductor manufacturing; soft errors; Aerospace electronics; Atmosphere; Atomic layer deposition; Degradation; Embedded system; IEC standards; Ionization; Neutrons; Radiation effects; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
  • Print_ISBN
    0-7695-2406-0
  • Type

    conf

  • DOI
    10.1109/IOLTS.2005.55
  • Filename
    1498177