Title :
Evaluation of SET and SEU effects at multiple abstraction levels
Author :
Anghel, L. ; Leveugle, R. ; Vanhauwaert, P.
Author_Institution :
TIMA Lab., Grenoble, France
Abstract :
This paper reviews the main approaches used to evaluate the effect of single event transients and single event upsets in digital circuits described at different abstraction levels. The two fault models are first discussed with respect to the circuit description levels, then complementary dependability evaluation methods are summarized.
Keywords :
fault diagnosis; integrated circuit testing; performance evaluation; radiation effects; SET effects; SEU effects; complementary dependability evaluation; digital circuits; fault models; multiple abstraction levels; Analytical models; Circuit faults; Combinational circuits; Error analysis; Hardware; Integrated circuit modeling; Random access memory; Read-write memory; Single event upset; Voltage;
Conference_Titel :
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN :
0-7695-2406-0
DOI :
10.1109/IOLTS.2005.28
