• DocumentCode
    1818887
  • Title

    How to cope with SEU/SET at system level?

  • Author

    Pignol, Michel

  • Author_Institution
    CNES, Toulouse, France
  • fYear
    2005
  • fDate
    6-8 July 2005
  • Firstpage
    315
  • Lastpage
    318
  • Abstract
    When using electronic commercial components for developing embedded computers dedicated to hard real-time applications (aeronautics, space, ...), protection against single event effects are required. An overview of such protections to be implemented at architecture and system levels is provided, to reach the high safety/availability requirements of avionics and space domains.
  • Keywords
    avionics; embedded systems; fault tolerant computing; radiation effects; SET; SEU; electronic commercial components; embedded computers; system level; Aerospace electronics; Application software; Computer architecture; Costs; Fault tolerance; Hardware; OFDM modulation; Protection; Safety; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
  • Print_ISBN
    0-7695-2406-0
  • Type

    conf

  • DOI
    10.1109/IOLTS.2005.34
  • Filename
    1498181