Title :
How to cope with SEU/SET at system level?
Author_Institution :
CNES, Toulouse, France
Abstract :
When using electronic commercial components for developing embedded computers dedicated to hard real-time applications (aeronautics, space, ...), protection against single event effects are required. An overview of such protections to be implemented at architecture and system levels is provided, to reach the high safety/availability requirements of avionics and space domains.
Keywords :
avionics; embedded systems; fault tolerant computing; radiation effects; SET; SEU; electronic commercial components; embedded computers; system level; Aerospace electronics; Application software; Computer architecture; Costs; Fault tolerance; Hardware; OFDM modulation; Protection; Safety; Single event upset;
Conference_Titel :
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN :
0-7695-2406-0
DOI :
10.1109/IOLTS.2005.34
