DocumentCode :
1819560
Title :
Software based in-system memory test for highly available systems
Author :
Singh, Amandeep ; Bose, Debashish ; Darisala, Sandeep
Author_Institution :
Sun Microsystems, Inc., Silicon Valley, CA, USA
fYear :
2005
fDate :
5-5 Aug. 2005
Firstpage :
89
Lastpage :
94
Abstract :
In this paper we describe a software based in-system memory test that is capable of testing system memory in both offline and online environments. A technique to transparently "steal" a chunk of memory from the system for running tests and then inserting it back for normal application\´s use is proposed. Factors like system memory architecture that needs to be considered while adapting any conventional memory testing algorithm for in-system testing are also discussed. Implementation of the proposed techniques can significantly improve the system\´s ability to proactively detect and manage functional faults in memory. An extension of the methodology described is expected to be applicable for in-system testing of other system components (like processor) as well.
Keywords :
built-in self test; integrated circuit testing; integrated memory circuits; functional faults; in-system memory test; memory testing algorithm; offline environments; online environments; system memory architecture; Built-in self-test; Computer architecture; Fault detection; Manufacturing; Memory architecture; Operating systems; Performance evaluation; Software testing; Stress; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Memory Technology, Design, and Testing, 2005. MTDT 2005. 2005 IEEE International Workshop on
Conference_Location :
Taipei
ISSN :
1087-4852
Print_ISBN :
0-7695-2313-7
Type :
conf
DOI :
10.1109/MTDT.2005.34
Filename :
1498209
Link To Document :
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