• DocumentCode
    1819560
  • Title

    Software based in-system memory test for highly available systems

  • Author

    Singh, Amandeep ; Bose, Debashish ; Darisala, Sandeep

  • Author_Institution
    Sun Microsystems, Inc., Silicon Valley, CA, USA
  • fYear
    2005
  • fDate
    5-5 Aug. 2005
  • Firstpage
    89
  • Lastpage
    94
  • Abstract
    In this paper we describe a software based in-system memory test that is capable of testing system memory in both offline and online environments. A technique to transparently "steal" a chunk of memory from the system for running tests and then inserting it back for normal application\´s use is proposed. Factors like system memory architecture that needs to be considered while adapting any conventional memory testing algorithm for in-system testing are also discussed. Implementation of the proposed techniques can significantly improve the system\´s ability to proactively detect and manage functional faults in memory. An extension of the methodology described is expected to be applicable for in-system testing of other system components (like processor) as well.
  • Keywords
    built-in self test; integrated circuit testing; integrated memory circuits; functional faults; in-system memory test; memory testing algorithm; offline environments; online environments; system memory architecture; Built-in self-test; Computer architecture; Fault detection; Manufacturing; Memory architecture; Operating systems; Performance evaluation; Software testing; Stress; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Technology, Design, and Testing, 2005. MTDT 2005. 2005 IEEE International Workshop on
  • Conference_Location
    Taipei
  • ISSN
    1087-4852
  • Print_ISBN
    0-7695-2313-7
  • Type

    conf

  • DOI
    10.1109/MTDT.2005.34
  • Filename
    1498209